Simulation and Analysis of Raw Silk Defects

)6Joumal of Donghua University(Eng. Ed.) Vol. 28, No. 1 (2011)Simulation and Analysis of Raw Silk DefectsSHI Jia-li( 史佳丽) , ZHOU Guo-li(周国丽), FAN Rong-rong(范蓉蓉), CHEN Qing-guan(陈庆官) "Jiangsu Key Laboratory of Silk Engineering, College of Textile and Clothing Engineering , Soochow University , Suzhou 215021 , ChinaAbstract: To test the relibility and stability of the inspectingsilk[4] ，this simulating system offers favourable conditions forprogram of the electronic inspection system for raw silk， afurther study on the defects analyzing software of the electronicsimulating program is developed to simulate various defect caseswith the software tool of Laboratory Virtual Instrumentinspection system for raw silk .Engineering Workbench( LabVIEW). Many techniques, such asFeatures of Practical Tested Sizerandom numbers, shift registers, for loop, case structures andwaveforms, are used to facilitate the simulation. The simulatedGraph of Raw Silkdefects are inspected by the inspecting program sucessfully , whichproves the electiveness of the simulating program.In the reeling workshop, the fixed size reeling is usuallyKey words: raw silk; defects; simulation; progrumused. The size of raw silk is sensed by the sensor. When theCLC number: TS147Document code: Asize decreases to the limit for cocoon feeding, a signal is givenArticle ID: 1672 5220(2011 )02 -0096 -04to the cocoon supplying and feeding is ended[5]. Because thesize of raw silk gets smaller or ends may get dropped in theIntroductionreeling process, the inspected size of raw silk may be smallerthan its seting size, which means the friction between detectorChina has a long history of silk, with 70% production inglass and silk decreases. When the size of raw silk decreases tothe world and more than 80% exports in the world trade'"l.the limit for cocoon feeding, the lever falls down, and the end-Inspection for raw silk plays a very important role in enhancingfeeding signal will be sent out. Afler feeding is ended, the sizethe silk quality[21. According to the study on the inspectionof raw silk suddenly increases , approximately to that of the lastfor raw silk(3] , in our laboratory , inspections for evenness andend feeding， and the process repeats. The defects appeardefects- two of the most important items of the silk insectionrandomly when the raw silk size changes greatly[6].are being studied. A sensor was invented and related analysingThe data of raw silk in Fig. 1 are collected by a flamentsoftware of the electronic inspection system for raw silk wasyarn tester YG139 of China Aviation Industry Corporationdeveloped. In order to test the reliabilit and stability of theSuzhou Changfeng Co. ，Ltd. The test speed is 400 m/ minsoftware, a large number of samples should be collected fromand the sensor is capacitive. The principle of the capacitivethe silk inspection bureaus and silk factories. However, it issensor is that the change of silk size is tested by sensing theimpssible to obtain all kinds of defect cases only from thechange of the medium capacity of a certain length of silk[7].inspection institutions and factories and these procedures areAs Fig.l shows, the change of silk size is periodical and theusually costly and inconvenient. Therefore, according to thetendency of every period is a gradual decrease. Furthermore ,features of defects collected before, considering the graphthere are many peaks and vales in Fig. 1, which are the calledcharacteristic of raw silk, the number and type of defects ofdefects. The task of the electronic inspection for raw silk is toraw silk, a simulating program is developed to simluate variousdistinguish， sort and count these defects. According to thedefect cases which can be used to test the ectronic inpsectionfeatures above, the present software resource in our laboratorysystem. Since there is a lack of simulating defects of rawis used to simulate the size graph of the defects of raw silk.0.5,45 t0.425 t.20.1550000 100 000150 000200 000250 000300 000 350 000 400 000Sample numbersFig.1 Practical tested graph of raw silkare graded by virtue of dfferent sectional areas and lengths[81.Simulating Programs for Raw SilkAs Table 1 shows, the sectional areas are viewed from theDefectsherizontal perspectives and the length from the verticalparts and 40 grades2.1 Simulating ideawhic中国煤化工C，D, E), 10 gradesAccording to“Standards of Electronic Testing for RawthiclYHCNMH(_grades' thin nodes (K,ilk ( Draft)" put forward by the research group of ChineseL,Ito the major and minorstandard of electronic testing for raw silk, defects of raw silkdefects in the traditional inspection. Thick nodes are equivalentRece2009-10-13Keceived date:$ Correspondence should be addressed to CHENQing-guan, E-mail: qgchen@ suda. edu. cnJoumal of Donghua University(Eng. Ed.) Vol. 28, No. 1 (2011)97to the neat defects[8] . Thin nodes refer to thinner places longercollected every 1 mm. The length listed in Table 1 shows thethan 600 mm, which are resulted from serious lack of feedingnumber of continuously appearing points. For example, theends for raw silk, broken ends of high speed loom and so on.length of B4 is 2-7 mm, which means 2-7 points of more than+ 400% appear continuously, resulting in a big slub. For thickTable 1 Grading graph of raw silk defectsor thin nodes, due to their longer length, they can be realizedSlub/ mm1-22-7 7-1010-20 >20by elongating arayswith LabVIEW. Because of the endfeeding while reeling, the appearing probabilities of big or+ 400%AB4DEmiddle slubs and thin nodes are relatively small, while+ 250%A3D3E3probabilities of small slubs and thick nodes relatively are large.+ 150%A2DXTherefore, relative parameters which depend on the appearing+ 100%AI:1probability of each kind of defects need to be set to make thesimulated defects graph of raw silk more close to the practicalThick nodes/mm 10-40 40-80 80 -250 250 -600 >600tested graph of raw silk.+35%P2C12J22.2 Simulating program+15%FncLabVIEW is a graphic programming language, developedby American NI company. The simulating programs areThin nodes/ mm10-.40 40-80 80-250 250-600 >600developed with LabVIEW for 20/22D-raw silk according tograding graph of raw silk defects. The x-axis of the graph is-15%K1LM1Nthe number of sampling points. There are 1 000 000 points in- 40%K2V2N2Fig.2，in which i 000 m isconsidered as a stage. Then,defects with different sectional areas and lengths are added toDefect inspection for raw silk above is set and expressedthe sawtooth wave including slubs, thick nodes, and thinby the surface features and processing characteristics.nodes. The sectional area is the height of the peak or vale,According to the expression and classification of defects, thwhich is realized by adding or subtracting corresponding timesdefect graph of raw silk is simulated.of the average size of raw silk and then adding a randomAccording to the defect graph in Fig. 1, the whole graphnumber. Relative parameters in the program depend on thetakes on a periodic zigzag and each zigzag gradually declines.appearing probability of defects， and defects can be addedDue to the features above, it is decided to use the sawtoothaccording to any grade of raw silk. The length of defects iswave to simulate the general trend of the raw silk size.realized by adding shift registers. In the program, three shiftAccording to Table 1, the size and randomicity of defectsregisters and a random number are added for slubs of differentshould be considered from both the horizontal and verticaltimes, which satisfy the randomicity of different lengths ofaspects. The horizontal aspect corresponds to the sectional sizedefects. However, as for thick nodes and thin nodes, due toof defects and it is divided into 8 ranges from -40% to 400%their long lengths, arrays are elongated on the basis of addingor three parts, which are slubs ( 100% -400% and above),three shift registers. For example, 1 mm is elongated to 10thick nodes (15% -35% and above) and thin nodes ( - 15%.mm (1 point as 10 points), which is able to realize longer-40% and below). The percentages hereinto mean the timeslengths of defects. Finally, the graph of slubs, thick nodes,of the average sectional size, which can be realized by randomand thin nodes are combined together. Because the simulatingnumbers with L aboratory Virtual Instrument Engineeringobject is 20/22D-raw silk, amplitude should be at 21，whichWorkbench( LabVIEW). The vertical aspect correspondss tomakes the average size of raw silk fluctuate at about 21, andthe length of defects. Slubs are shorter, while thick nodes andthe thickness of defects ( the height in waveform) is severalthin nodes are longer. The speed of winding machine is fromtimes of 21. Figure3 is the flow process chart of simulaing400 m/min to 600 m/min or higherl9] to meet the needs ofdefects of raw silk. Figure 2 is the waveform graph. Figure 4distinguishing defects. So the sizce of raw silk needs to beis part of the simulating program.140「20 t00 t80 t10 t20 r000 20000 30000 40000 50000 60000 70000 80 000 90000 99 999Sample numbersFig.2 Simulating graph of dects of raw silk| I 000 m-sawtoothAdjust the waveCenter sizxe of| Each sectional time| wavc by for loopamplitude to 21raw slk is21adds a random number中国煤化工Randomicity forShit registers adddifferent heightsa random numberCNMHGDemands for .Case structureSimulated defects graph of raw sik morelonger lengthset parameicrsclose 1o pracical lested graph of raw silkFig.3 Flow process chart of simulating defects of raw silk)8Joumal of Donghua University(Eng. Ed.) Vol. 28, No. 1 (2011)网o[1n|C国D四D四三年CaDAB区Fig.4 Part of the simulating program2.3Test inspecting system with the simulatingFigure 5 shows the inspecting results of the simulated silkprogramdefects. It can be seen that the categories and numbers ofAn electronic system for inspecting defects of raw silk isdefects displayed in the front panel are the same as those of thedeveloped in our laboratory, and related inspecting softwaresimulated raw silk, which confrms the correctness of the( inspecting program) for raw silk is programmed. THsimulating idea and program.simulating program is utilized to test the inspecting system.. Slub(1specifiction: 20/22D speed: 480m/mH+250% 0150%Thick(cm) P(1-4)C(4-8)日(8- 25) I (25-60) J(>60)>+15%。Thin(cn) } K(1-4)L(4-8) M(8-25)■(25- 60)0(360)0%广140 r12000 t8(。6(4(20°O 10000000000000000 60000 70000 80000 90000 99 999Samples numberFig.5 Inspecting results of the simulated silk defects2.4 Parameter adjustment of the programsadjusting the relative parameters in the simulating programs.According to the rules for the defects grading of automaticTable 2 comes from“Standards of Electronic Testing for Rawinspection for raw silk in“RAW SILK 1995”[10], the gradingSilk (Draft)", and the test report is the result of inspectingcriterion has changed from scores to number of defects of eachdefects of 150 km-raw silk by using the electronic analyzer forgrade. For this rule, the simulating program for raw silk canraw silk. In the table, the scores of every kind of defects havesimulate graphs of different grades, which are realized bybeen transformed into the numbers per 100 km.setting the appearing probabilities of defects of some grade andSlub/mmA中国煤化工.+ 400%0.0MHCNMHG0.7+ 250% .1.0+ 150%4.01.33.3 .+ 100%18. 72. 7.Jouma/ of Donghua University (Eng. Ed.) Vol. 28, No. 1 (2011)99(Table 2 continued)Thick/cmFH+ 35%3.31.32.00.0+ 15%117. 357.355.324.018.0Thin/cmKMN0-15%472.0236.7341.3158.7164.7- 40%0.7Slub(m) 5 Ispecifiction: 20/22D speed: 400%/mi/Number/100km A(1-2) B(27)C(7 10)D(10 20)B(>20)+400%000+250%+150%100%Thiok(cn)|F(1-4)C(4-8)8(8 -25) 1(25 60)J(≥60)+35%137+15% 10247 3623 13Thin(em) K(1-4)L(4-8) M(8 -25) (25-60)0(>60)15%461 213 205 104 78善40-10 1000 20000 300000 40000 500000 60000 70000 80000 90000 99999Samples numberFig.6 Inspecting resuls of the simulated practical defectsThe parameters of simulating program are adjustedInspection [J]. Chinese Joumal of Scienific Instrument, 2006,according to the data in Table 2. The simulated raw silk is27(6): 375-377. (in Chinese)[2] Hu w, Wang L M. Challenge and Suggestion of Technologicalinspected by the inspecting program of the electronic inspectionInnovation of Inspection for Raw Silk [ J]. Inspection andsystem for raw silk. Figure 6 gives the inspecting results. ItQuarantine Science, 2007, 17(1/2): 107-109. ( in Chinese)can be found that the numbers of defects are comparable with[ 3]XiaJ,YuWD. ASummary of the Testing Methods for Rawthose in Table 2, which further proves the correctness of theSilk at Abroad [J]. China Fiber Inspection, 2006(6): 4649.simulating program. And it can be expected that defects can be(in Chinese)added or subtracted according to the ratio reflected in Table 2[4] BaiL, XieJ, LiLF, et al. The Simulation of silk Size Curveto simulate the graph for raw silk of any grade.[J]. Joumal of Suzhou Instiute of Silk Textile Technology,1998, 18(1): 19. (in Chinese )3 Conclusions[ 5 ] Suzhou Institute of Silk Textile Technology, Zhejang Instiuste ofSilk Textile Technology.“Science of Silk-Making" [M].2nded. Bejing: Publishing House of Textile Industr, 1993: 49-In the simulating programs, techniques of LabVIEW60. (in Chinese)software, such as random numbers, shift registers, for loop, case[6] Fei w C, Cui X L, Zhu M N. Relation between Denierstructures, and waveforms, are used well to simulate the graph ofIodicalor and Raw Sik Finenes [J]. Silk, 2000( 10): 12-13.raw sik defects, and the parameters of the simulating programs[ 7 ] Zhao z M, Zhou Y, Yang Q. Elementary Discussion aboutcan be adjusted to simulating defects of different grade's rawCause Fomation of Flaws Error in Raw Silk Test by Usingsilk. The simulated defects are inspected by the inspectingCapacitance Evenness Tester [J]. Silk Monthly, 2006 (10):30-33program sussfully, which proves the effectiveness of the[ 8 ] Study Group of Chinese Standard of Electronic Testing for Rawsik. Standards of Electronic Testing for Raw Silk ( Draft)program. The inspecting software will combine CompactRIO to- angzhou, 2006: 10-17.realize the synchronal ollction， analysis, processing and中国煤化工resing Centes Syteindisplay of the size and defects of raw silk in the future study.IHCNMHGSoochow University,References[10] International Silk Standard Comite.. RAW SILK 1995 [C]. .Intemational Silk Association Brighten Conference, Great[1] Hu w, Wang L M. Analysis of Raw Silk Present AutomaticBritain, 1995: 5-7.